Waferpedia

Comparison ledger

200 versus 2367 Brightfield

KLA 200 and KLA 2367 Brightfield, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
200KLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA 200KLA 2367
Specifications
Supported equipment familyKLA 200 series pattern inspection stations[1]
Related supported equipmentKLA Tencor 300 Series Pattern Inspection Stations, STARlight tools, and URSA tools[1]
Data hub function9X Fileservers are central data hubs serving KLA Tencor reticle inspection equipment[1]
Software function9X System Software supports storage and retrieval of setup and result files and several analysis functions[1]
Power Requirements208 V, 16 A, 50 / 60 Hz, 3 Phase[2]
CE MarkedYes[2]
ConfigurationORS Upgrade[2]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org
  2. [2]inventory listing