Comparison ledger
KLA .204 PSL Wafer, KLA Candela 8620 Surface, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | 2011– |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | KLA Candela 8620 |
| Specifications | ||
| Configuration | NIST Traceable[1] | 50/60 Hz[4] |
| Wafer Size | 8 inch[2] | — |
| Traceability | NIST[3] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[2] | — |
| Compatible tools | Surfscan 6xy0 and Sp1 particle counters[2] | — |
| Phase | — | 1 Phase[4] |
| OEM | — | KLA[4] |
| Model | — | Candela 8620[4] |
| Type | — | Surface inspection system[4] |
| Inspection application | — | Substrate and epitaxy wafer inspection[5] |
| Target manufacturing | — | High brightness LED manufacturing[5] |
| Power | — | 115 AC[4] |
| Frequency | — | 50/60 Hz[4] |
| Current | — | 12 Amp[4] |
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