Comparison ledger
KLA .204 PSL Wafer, Nikon Eclipse L 200, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Eclipse L 200Nikon | |
|---|---|---|
| OEM | KLA | Nikon |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | Nikon Eclipse L 200 |
| Cited variants | — |
|
| Specifications | ||
| Configuration | NIST Traceable[2] | Unable to test, sold As-Is[5] |
| Wafer Size | 8 inch[3] | — |
| Traceability | NIST[4] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[2] | — |
| NIST Traceable | Yes[3] | — |
| Compatible tools | Surfscan 6xy0 and Sp1 particle counters[3] | — |
| OEM | — | Nikon[5] |
| Model | — | Eclipse L 200[5] |
| Tool family | — | Nikon Eclipse L 200 ND[1] |
| Tool type | — | IC inspection microscope[1] |
| Wafer support | — | 6-inch wafer support[1] |
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