Waferpedia

Comparison ledger

.204 PSL WaferversusGen-6

KLA .204 PSL Wafer, Sonoscan Gen-6, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
Gen-6Sonoscan
OEMKLASonoscan
CategoryMetrology & InspectionMetrology & Inspection
Wafer size—300mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation—new generation
FamilyKLA .204 PSL WaferSonoscan Gen-6
Specifications
ConfigurationNIST Traceable[1]—
Wafer Size8 inch[2]—
TraceabilityNIST[3]—
Compatible ToolsSurfscan 6xy0, Sp1[1]—
NIST TraceableYes[2]—
Compatible toolsSurfscan 6xy0 and Sp1 particle counters[2]—
Technology—PolyGate™ technology with Multi-Gate™ and Probing-Gate™ functions capable of single and multi-focus imaging[4]
Gates per channel—Up to 100 gates per channel[4]
Sampling rate—2 Gsps[4]
Scanner—Inertially Balanced Linear Motor Scanner[4]
Scan reference platform—Tower-mounted scan reference platform and sample fixture[4]
Scanning area—Open-access scanning area[4]
Scan capacity—Capable of scanning JEDEC trays or a 300mm wafer[4]
Temperature control—Water recirculation and optional inline temperature control[4]
Analysis software—SonoSimulator for simplified analysis of stacked die parts[4]
Data analysis—Digital Image Analysis (DIA) quantifies acoustic data and supports automatic accept/reject criteria[4]
Rescanning—Virtual Rescanning Mode (VRM) stores comprehensive data for complete analysis after the sample is no longer available[4]
Instrument type—C-mode Scanning Acoustic Microscope[4]
Wafer size capability—300mm wafer[4]
Control software operating system—Windows 7 Ultimate[4]
Scanner type—Inertially Balanced Linear Motor Scanner[4]
Cooling / fluid handling—Water recirculation and optional inline temperature control[4]
Software analysis tools—SonoSimulator, Digital Image Analysis (DIA), and Virtual Rescanning Mode (VRM)[4]
Optional imaging mode—Frequency Domain Imaging (FDI)[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]waferpedia.comwaferpedia.com
  4. [4]ncf.uic.eduncf.uic.edu