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.204 PSL WaferversusScientific FEI Helios NanoLab 600 FIB-SEM

KLA .204 PSL Wafer, Thermo Fisher Scientific FEI Helios NanoLab 600 FIB-SEM, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
OEMKLAThermo Fisher
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .204 PSL WaferThermo Fisher Scientific FEI Helios NanoLab 600 FIB-SEM
Specifications
ConfigurationNIST Traceable[1]Schottky FE mounted on the NG hot swap gun module[4]
Wafer Size8 inch[2]—
TraceabilityNIST[3]—
Compatible ToolsSurfscan 6xy0, Sp1[1]—
NIST TraceableYes[2]—
Compatible toolsSurfscan 6xy0 and Sp1 particle counters[2]—
Magnification—69x-2300000x[4]
Stage Control—5 axes motorized XYZRT 6” UHR stage with piezo control[4]
Beam - Schottky FE mounted on NG hot swap gun module—Schottky field emitter on NG hot swap gun module[4]
Beam - Gallium Liquid Metal—Gallium liquid metal ion source[4]
Beam - ELSTAR—ELSTAR[4]
Beam - Sidewinder—Sidewinder ion column[4]
Electron Column—Present[4]
ION Column—Present[4]
Resolution (Optional WD) - 15 kV—0.9 nm @ 15 kV (optional WD), 1.4 nm @ 15 kV (optional WD)[4]
Resolution (Coincident WD) - 15 kV—1 nm @ 15 kV[4]
Resolution (Coincident WD) - 5 kV—1.6 nm @ 5 kV[4]
Resolution (Coincident WD) - kV (unspecified)—2.5 nm @ (unspecified kV)[4]
Resolution (Coincident WD) - 30 kV—5 nm @ 30 kV[4]
Stage Travel - X/Y—150 mm[4]
Stage Travel - Z—0-20 mm[4]
Stage Tilt—-10° to +60°[4]
Detector—Through-lens detection (TLD) for SE and BSE[4]
Omniprobe—Autoprobe 200[4]
STEM Detector—Retractable[4]
Plasma Cleaner—Ibss Group GV10x[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]waferpedia.comwaferpedia.com
  4. [4]inventory listing