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Thermo Fisher

Scientific FEI Helios NanoLab 600 FIB-SEM

Scientific FEI Helios NanoLab 600 FIB-SEM — Inventory photo
Fig. 01Scientific FEI Helios NanoLab 600 FIB-SEMInventory photo[1]

What is it?

The Thermo Fisher Scientific / FEI Helios NanoLab 600 is a FIB-SEM (Focused Ion Beam - Scanning Electron Microscope).

What do the numbers mean?

Optics & imaging10

Electron Column[1]
Accurate?
ION Column[1]
Accurate?
Resolution:[1]
Accurate?
0.9 nm at 15 kV[1]
Accurate?
1.4 nm at 15 kV[1]
Accurate?
1 nm at 15 kV[1]
Accurate?
1.6 nm at 5 kV[1]
Accurate?
2.5 nm at kV[1]
Accurate?
5 nm at 30 kV[1]
Accurate?
Magnification
69x-2300000x[1]
Accurate?

Control & software1

Stage Control
5 axes motorized XYZRT 6” UHR stage with piezo control[1]
Accurate?

Configuration & options9

Schottky FE mounted on the NG hot swap gun module[1]
Accurate?
Gallium Liquid Metal[1]
Accurate?
1000 h[1]
Accurate?
ELSTAR[1]
Accurate?
Sidewinder[1]
Accurate?
Optional WD[1]
Accurate?
Coincident WD:[1]
Accurate?
X/Y = 150mm[1]
Accurate?
Z = 0-20mm[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the Scientific FEI Helios NanoLab 600 FIB-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Scientific FEI Helios NanoLab 600 FIB-SEM are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Scientific FEI Helios NanoLab 600 FIB-SEM are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Scientific FEI Helios NanoLab 600 FIB-SEM are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Scientific FEI Helios NanoLab 600 FIB-SEM are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Scientific FEI Helios NanoLab 600 FIB-SEM is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
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Last updated Jul 29, 2026.

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