Comparison ledger
KLA 2132 and KLA Candela CS 20 V, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | 2132KLA | |
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 2132 | KLA Candela CS 20 |
| Specifications | ||
| Product type | Wafer inspection system[1] | — |
| Relationship to KLA 2135 | Earlier model than the KLA 2135[1] | — |
| Wafer size (primary) | 200mm (8")[2] | — |
| Wafer size (alternate) | 4", 5", 6" capable[2] | — |
| Throughput | 2–8 wafers per hour[2] | — |
| Sensitivity | >0.25 µm pixels[2] | — |
| Inspection type | Patterned wafer defect inspection[2] | — |
| Optics | Brightfield, small-pixel, high data rate digital image processing[1] | — |
| User interface | DOS operating system[3] | — |
| SAT capability | Segmented Auto Threshold (SAT) included[2] | — |
| Calibration wafer | 8" DSW calibration wafer included[2] | — |
| Vintage (year of introduction) | 1995[2] | — |
| Voltage | — | 230 VAC[4] |
| Configuration | — | 50/60 Hz[4] |
| Phase | — | 3 Phase[4] |
| Chuck | — | 2-5"[5] |
| Wafer sizes | — | 4-inch and 6-inch[6] |
| Chuck sizes | — | 4-inch and 6-inch[6] |
| Software vs | — | Candela Wafer Version 6.8 Build 16[6] |
| Laser specs | — | 405 nm oblique-incidence laser and 660 nm normal-incidence laser[6] |
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