Waferpedia

KLA

2132

Metrology & InspectionKLA 2132 family
Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

KLA2132
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Preceded by
First in line
This tool
2132
Succeeded by
2135
All related

What is it?

The source describes the KLA 2135 as a wafer inspection system and states that it delivers a two- to three-times throughput improvement over the earlier model KLA 2132. No additional specifications for the 2132 are stated in the provided source.

What can it run?

Process applications and technology nodes documented for this tool.

  • In-line monitoring of advanced processes
  • Detection of yield-relevant defects on process layers

What do the numbers mean?

Wafer handling6

Product type
Wafer inspection system[1]
Accurate?
Wafer size (primary)
200mm (8")[2]
Accurate?
Wafer size (alternate)
4", 5", 6" capable[2]
Accurate?
Throughput
2–8 wafers per hour[2]
Accurate?
Inspection type
Patterned wafer defect inspection[2]
Accurate?
Calibration wafer
8" DSW calibration wafer included[2]
Accurate?

Optics & imaging1

Optics
Brightfield, small-pixel, high data rate digital image processing[1]
Accurate?

Control & software1

User interface
DOS operating system[3]
Accurate?

Configuration & options4

Relationship to KLA 2135
Earlier model than the KLA 2135[1]
Accurate?
Sensitivity
>0.25 µm pixels[2]
Accurate?
SAT capability
Segmented Auto Threshold (SAT) included[2]
Accurate?
Vintage (year of introduction)
1995[2]
Accurate?

Vintage & configurations

Interested in this tool?
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What replaced it?

  • successorKLA 2135described as the earlier model, with the 2135 offering two- to three-times throughput improvementsource[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Frequently asked questions

What wafer sizes does the KLA 2132 support?

The KLA 2132 is configured for 200 mm wafers and can be modified to handle 150 mm or 100 mm wafers.[3][2]

Not publicly documented

The following facts about the 2132 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 2132 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 2132 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 2132 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 2132 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 2132 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.orgweb.archive.org
  2. [2]gsemi.comgsemi.comgsemi.com
  3. [3]tbcl.com.twtbcl.com.twtbcl.com.tw
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Last updated Aug 13, 2026.

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