Waferpedia

Comparison ledger

2351 versus Surfscan SP 1 TBI

KLA 2351 and KLA Surfscan SP 1 TBI, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
2351KLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer sizeWafer Transfer System・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA 2351KLA Surfscan
Specifications
ConfigurationWith HDD & Software[1]50/60 Hz[3]
Load Port Qty2[1]
Wavelength Illumination370~720 nm[1]
Wavelength BandVisible, UV[1]
Pixel Size0.16μm / 0.20μm / 0.25μm / 0.39μm / 0.62μm[1]
Array Defect Capture Rate≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[1]
Array False Defect Rate≤1.5%(all sizes)[1]
Random Defect Capture Rate≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[1]
Random False Defect Rate≤1.5% (all sizes)[1]
Repeatability≥90% (20 consecutive run on the same DSW wafer)[1]
Wafer sizeWafer Transfer System[1]・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil[3]
Phase208-240 V, Single phase[3]
Full Load Amps24 A[3]
Machine Main Breaker Rating30 A[3]
Ampere Rating of Largest Load12 A[3]
Bright Field (DIC) Option, P/N515990[3]
XY Coordination, P/N0082158-000[3]
Bright Field Sizing, P/N0082158-000[3]
Haze Normalization, Haze Analysis, P/N0081928-000[3]
SEC-1, P/N0021643-000[3]
HSMS, P/N528080[3]
PC-NFS Cient, P/N556025[3]
Desktop PC Software Option, P/N528170[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing
  3. [3]inventory listing