Comparison ledger
KLA Alpha Step D 300 Stylus and KLA Surfscan SP 1 DLS Particle Defect, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA Alpha Step | KLA Surfscan |
| Cited variants | — | |
| Specifications | ||
| Configuration | Issue with the style module[3] | 300mm FOUP handler[1] |
| Instrument type | Stylus-based surface profiler[4] | — |
| Stylus tip radius | 2 µm[4] | — |
| Step height measurement range | 50 nm to 300 µm[4] | — |
| Measurement principle | Stylus placed in contact with and dragged along the substrate surface; vertical deflection measures change in step height[4] | — |
| Supported substrate types | Silicon, Silicon Germanium, Quartz, Sapphire, Glass, Germanium, Silicon Carbide, Gallium Nitride, III-V, Gallium Arsenide, Polymer, Carbon Polymer Based, Lithium Niobate[4] | — |
| Supported substrate sizes | Pieces, 2 inch, 3 inch, 4 inch, 6 inch wafer[4] | — |
| Maximum load | 1[4] | — |
| Cleanliness | Flexible[4] | — |
| Stylus scan distance used in roughness testing | 3 mm[5] | — |
| Manufacturer location | KLA-Tencor Corporation, Milpitas, CA[5] | — |
| Retested the CPU at bench test | — | CPU boots up with display but mouse and keyboard not working[1] |
| 75mW Laser | — | visually still lasting, but unable to determine the life span or quality of the laser due to inaccessibility of LonBrowser diag file.[1] |
| Need replacement of Bright Field laser | — | Hene 7mW laser PS is dead (Model: 103-2300-6-2 194016)[1] |
| 2 loadports | — | 1 not functioning[6] |
| Largest Load | — | 26 A (Laser)[6] |
| Input Current | — | 30 A, 3 Phase, 50/60 Hz[6] |
| Phase | — | 3 Phase[2] |
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