KLA
The KLA Surfscan SP 1 DLS is a particle defect detection system for semiconductor wafers.[1][2][3][4][5]

Particle defect inspection systems scan wafer surfaces for light scattering or other optical signatures associated with particles and surface defects. Particle defect inspection systems are used in wafer fabs as metrology and inspection tools to monitor contamination, excursion risk, and process cleanliness.
Surface inspection tools move wafers through an optical inspection path and collect scattered or reflected light from the wafer surface. Surface inspection tools use that optical signal to flag candidate defects for process monitoring and yield analysis.
Particle inspection tools are placed at monitoring points around wafer processing where contamination or added defectivity can affect downstream yield. Particle inspection tools are commonly used after deposition, etch, clean, polish, and similar wafer surface changing steps.
Documented failure modes, common issues, and field considerations.
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Surfscan SP 1 DLS Particle Defect System, 12 inch | — | 2002 | Listed as a 12-inch configuration with FOUP handler; one source describes it as non-operational, another notes Windows NT, two loadports, and input current details. | Equipment inventory listing[1] |
| Surfscan SP 1 DLS Particle Defect System, 8 inch | — | 2009 | Listed as an 8-inch configuration with a single-station FOUP handler and missing analog boards x2 and DC distribution board. | Equipment inventory listing[3] |
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The Surfscan SP 1 DLS is available in configurations for 200 mm (8 inch) and 300 mm (12 inch) wafers.[1][2][3][4]
The Surfscan SP 1 DLS runs on the Windows NT operating system.[2]
The following facts about the Surfscan SP 1 DLS Particle Defect are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Surfscan SP 1 DLS Particle Defect are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Surfscan SP 1 DLS Particle Defect are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the Surfscan SP 1 DLS Particle Defect is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Surfscan SP 1 DLS Particle Defect are on record.
Answerable by: an OEM parts catalog or a service engineer
No publicly hosted manuals, SOPs, or datasheets for the Surfscan SP 1 DLS Particle Defect are on record.
Answerable by: university cleanroom staff or an OEM application specialist
Last updated Oct 17, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.