Waferpedia

Comparison ledger

Archer XT+ Overlay MeasurementversusP-20H

KLA Archer XT+ Overlay Measurement, KLA P-20H, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle—Legacy
Lifecycle milestones——
Control system——
Generation——
FamilyKLA ArcherKLA P-20H
Specifications
Software version5.60[1]—
ConfigurationNew / Refurbished Items:[1]—
New system consumable partsShutter, HLS Lamp & Air Filters[1]—
Wafer size200 mm / 300 mm[2]8 inch[6]
FamilyKLA Archer[3]—
Tool type—Stylus profilometer[4]
Stylus tip radius—2 µm[4]
Stylus cone angle—60°[4]
Vertical range—325 µm[4]
Sensor element—Capacitive sensor element[4]
Motion stage—Precision motion stage[4]
Vertical resolution—Roughly nm scale[4]
Stage movement—8 inch[4]
Serial number—09940111[4]
Tool owner—Joseph Jacob[4]
Access mode—Walk-up tool (no reservation needed)[4]
S/N—09940111[4]
Category—Metrology & Inspection[5]

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Sources (6)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]fabsurplus.comfabsurplus.com
  3. [3]waferpedia.comwaferpedia.com
  4. [4]nanofab.utah.edunanofab.utah.edu
  5. [5]waferpedia.comwaferpedia.com
  6. [6]jenesisequipment.comjenesisequipment.com