Waferpedia

Comparison ledger

P-17 versus Surfscan SP 1 TBI

KLA P-17 and KLA Surfscan SP 1 TBI, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
P-17KLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA P-17KLA Surfscan
Cited variants
  • Tencor P-17 OF (Open Frame)[1]
Specifications
Instrument typeMechanical profilometer[2]
Z range1 mm[2]
Vertical resolution0.6 Å[2]
Lateral resolution0.5 µm[2]
Step height rangeNanometers to 1000 µm[1]
Constant force control0.03 to 50 mg[1]
Scan length (without stitching)200 mm[1]
Video camera5 MP high-resolution color[1]
Stylus tip radius options40 nm to 50 µm[3]
Stylus included angle options20 to 100 degrees[3]
Sample chuck range50 to 200 mm[1]
Phase208-240 V, Single phase[4]
Configuration50/60 Hz[4]
Full Load Amps24 A[4]
Machine Main Breaker Rating30 A[4]
Ampere Rating of Largest Load12 A[4]
Bright Field (DIC) Option, P/N515990[4]
XY Coordination, P/N0082158-000[4]
Bright Field Sizing, P/N0082158-000[4]
Haze Normalization, Haze Analysis, P/N0081928-000[4]
SEC-1, P/N0021643-000[4]
HSMS, P/N528080[4]
PC-NFS Cient, P/N556025[4]
Desktop PC Software Option, P/N528170[4]
Wafer size・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]kla.comkla.com
  2. [2]epfl.chepfl.ch
  3. [3]kla.comkla.com
  4. [4]inventory listing