Waferpedia

Comparison ledger

P-20H versus Surfscan SP 1 TBI

KLA P-20H and KLA Surfscan SP 1 TBI, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil
Process node
Introduced
Production run
LifecycleLegacy
Lifecycle milestones
Control system
Generation
FamilyKLA P-20HKLA Surfscan
Specifications
Tool typeStylus profilometer[1]
Stylus tip radius2 µm[1]
Stylus cone angle60°[1]
Vertical range325 µm[1]
Sensor elementCapacitive sensor element[1]
Motion stagePrecision motion stage[1]
Vertical resolutionRoughly nm scale[1]
Stage movement8 inch[1]
Serial number09940111[1]
Tool ownerJoseph Jacob[1]
Access modeWalk-up tool (no reservation needed)[1]
Phase208-240 V, Single phase[2]
Configuration50/60 Hz[2]
Full Load Amps24 A[2]
Machine Main Breaker Rating30 A[2]
Ampere Rating of Largest Load12 A[2]
Bright Field (DIC) Option, P/N515990[2]
XY Coordination, P/N0082158-000[2]
Bright Field Sizing, P/N0082158-000[2]
Haze Normalization, Haze Analysis, P/N0081928-000[2]
SEC-1, P/N0021643-000[2]
HSMS, P/N528080[2]
PC-NFS Cient, P/N556025[2]
Desktop PC Software Option, P/N528170[2]
Wafer size・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]nanofab.utah.edunanofab.utah.edu
  2. [2]inventory listing