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Comparison ledger

P-7 versus Surfscan SP 1 DLS Particle Defect

KLA P-7 and KLA Surfscan SP 1 DLS Particle Defect, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
P-7KLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA P-7KLA Surfscan
Cited variants
  • Surfscan SP 1 DLS Particle Defect System, 12 inch[1]
  • Surfscan SP 1 DLS Particle Defect System, 8 inch[2]
Specifications
equipment typeStylus profilometer[3]
equipment type categoryTopographical Metrology[4]
equipment name as listedStep Profilometer (KLA Tencor P-7)[4]
Step Height RangeNanometers to 1000 µm[5]
Stylus Tip Radius2 µm[6]
Stylus Bevel60°[6]
Max Scan Length150 mm[7]
Vertical Range1 mm[7]
Sample SizeUp to 150 mm[7]
Sampling RateHigher sampling rates increase data resolution, but can introduce noise above 200 Hz[6]
Applied Force0.03 to 50 mg[5]
Stylus MaterialDiamond[5]
Configuration300mm FOUP handler[1]
Retested the CPU at bench testCPU boots up with display but mouse and keyboard not working[1]
75mW Laservisually still lasting, but unable to determine the life span or quality of the laser due to inaccessibility of LonBrowser diag file.[1]
Need replacement of Bright Field laserHene 7mW laser PS is dead (Model: 103-2300-6-2 194016)[1]
2 loadports1 not functioning[8]
Largest Load26 A (Laser)[8]
Input Current30 A, 3 Phase, 50/60 Hz[8]
Phase3 Phase[2]

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Sources (8)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]Equipment inventory listing
  3. [3]tmi.utexas.edutmi.utexas.edu
  4. [4]wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu
  5. [5]kla.comkla.com
  6. [6]research.yale.eduresearch.yale.edu
  7. [7]pnf.uchicago.edupnf.uchicago.edu
  8. [8]inventory listing