LTX-Credence
ASL 1000 ATE alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Advantest
93000 C 200 E
Test & Probe
The Advantest 93000 C 200 E is a semiconductor tester.
Teradyne
Magnum II EV
Test & Probe
The Teradyne / Nextest Magnum II EV is a self-contained, low-power engineering test system for semiconductor testing, offered in variants such as the EV Final and EV 128.
Tenney
, TPS JR-A-F4T Junior compact temperature test chambers
Test & Probe
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
Rorze
03 RR 8120-001-001 Wafer Exchanger
Test & Probe
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
Applied Materials
0720 06060 Part
Test & Probe
Cascade Microtech
100 602 Calibration Kit
Test & Probe
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