Advantest
93000 C 200 E
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
The Advantest 93000 C 200 E is a semiconductor tester. The Advantest 93000 C 200 E is categorized under Test & Probe.[4]
How it works
General reference — not yet source-verifiedSemiconductor testers drive patterns into device pins, capture output behavior, and compare measured results against programmed limits and expected logic states. Test and probe systems are commonly configured to work with handlers or probers so that devices can be contacted repeatedly under automated test control.
Where it fits in the process flow
General reference — not yet source-verifiedTest and probe equipment is used after fabrication steps have created working integrated circuits and before final release of devices into downstream manufacturing or product flow. In wafer test service, a tester operates with a probe interface to contact pads on each die, while in packaged-device service the tester operates with an interface that mates to the package form.
Applications
The Advantest 93000 C 200 E is applied to the production test of digital integrated circuits. Typical device types include application-specific integrated circuits, system-on-chip products, microcontrollers, and other logic devices. The tester supports functional test, scan test, memory built-in self-test, and at-speed test. Mixed-signal capability, if configured, allows analog and RF test alongside digital channels. The system is used in high-volume manufacturing environments where throughput and test coverage are critical.[4]
What do the numbers mean?
Configuration & options4
- Missing 2xPS3600 bgs + cables[1]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Teradyne Catalyst— Same function class: Test & Probe, nullCompare in depthsource[1]
- Teradyne ETS 600— Same function class: Test & Probe, nullCompare in depthsource[1]
- LTX-Credence ASL 1000 ATE— Same function class: Test & Probe, nullCompare in depthsource[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the 93000 C 200 E are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 93000 C 200 E are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 93000 C 200 E are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 93000 C 200 E are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 93000 C 200 E are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 93000 C 200 E is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]93000 C 200 E — Advantest | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 21, 2026.
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