Test & Probe

The Agilent 11729C Carrier Noise Test Set is an integral part of a phase noise measurement system, capable of up-converting, down-converting, and phase/frequency demodulation.

The Electroglas EG 6000 e is a wafer prober used in semiconductor test and probe applications.

The ESPEC 212M is an environmental test chamber model documented in two user manuals on MetrologyManuals.

The Rasco SO 2000 Handler is a dual-temp tube-to-tube handler for SSOP 8 and 16 packages with 4 sites.

The ASM MS 896 is a mapping die sorter.

The Tektronix MDO 3024 Oscilloscope is a 200 MHz, 4-channel oscilloscope.

The Teradyne / Nextest Magnum 2 PV is a tester identified with a SA board, IPC board, manipulator, and Dell workstation.

The SUSS MicroTec PiXDRO LP 50 Inkjet is a desktop R&D inkjet printer for functional printing applications using PiXDRO technology.

The Keysight / Agilent 4072 B is a tester identified with the make Keysight / Agilent and model designation 4072 B.

The Ismeca NY32W is a 32-position turret platform for semiconductors on film-frame wafer media.

The Mitutoyo SJ-220 is a surface roughness tester with a 2.8-inch touchscreen, a HOME key, ISO 21920 compatibility, and optional wireless data transmission via U-WAVE-TIB.

The Electroglas 2001 CX Automatic Wafer Prober is an automatic wafer prober designed for wafer test and sort.

The Cascade Microtech FPD 100 Probe Positioners are a model of probe positioners manufactured by Cascade Microtech.

The Multitest InStrip Handler is a semiconductor test handler for strip-based devices.

The Chroma 58212 CLED Mapping Prober is a mapping prober.

General referenceThe Plasma-Therm VLR is identified here only as a test and probe tool. In this equipment class, such systems are used to make controlled electrical contact to device pads or test structures so measurements can be taken before assembly or at intermediate manufacturing stages.

Teradyne A 565 Tester is a 3-phase, 380 V tester with source-stated vintages from 1999 to 2006.

The ASM AS 899 is a test and sort machine.

The Keysight E 5080 B Vector Network Analyzer is a test and probe instrument in the Keysight E5080B ENA Series.

The Advantest T5593 is a memory ATE system designed for testing DDR2 SDRAM and other high-speed memory devices, capable of handling up to 256 devices.

The LTX / Credence Fusion MX is a tester system manufactured by LTX/Credence.

The Keysight / Agilent 4062 UX is a parametric tester.

The Teradyne A 300 is a tester.

The FormFactor / Cascade Microtech / Alessi REL 4500 is a 6-inch manual analytical wafer prober.

Agilent Infiniium DSO 8140 A is a digital storage oscilloscope rated at 1 GHz and 4 GSa/s.

The Cascade Microtech 103-754 is an x-y-z-θ probe positioner used in the HFTL 50-GHz Small-Signal Probe Station.

Keysight B 2902 A Precision Source Measure is a two-channel precision source measure instrument.

The Rasco SO 1000 is a handler with tri-temp capability that uses LN2 for cold and supports SSOP, SOIC, and TSSOP change kits.

The KLA Flexus F 2320 I is a stress measurement system for semiconductor wafers that supports 6-inch and 8-inch wafers and uses dual wavelength measurement.

The KLA Inspex Eagle Tester is a wafer handling and inspection system with 6-inch chuck and prealigner, 4-inch to 8-inch wafer capability, cassette-to-cassette handling, two ports, and a Zeiss microscope.

The Keysight / Agilent M 8190 A is an arbitrary waveform generator.

The Advantest 93000 PS 800 LTH is a tester with 768 channels.

The ESPEC LHU-113 is a service manual-listed environmental-test equipment model. The available source identifies ESPEC as a manufacturer of chambers and systems for reproducing temperature, humidity, thermal shock, pressure, and other environmental stresses.

General referenceThe Disco EAD 695 + is a test and probe system. Machines of this class are used to make temporary electrical contact to semiconductor devices or related substrates so they can be measured, screened, and verified during manufacturing.

The Advantest V 93000 SOC Series is a system-on-chip (SOC) test system with a variety of testhead boards including PS800, Clock, MSDPS, Digital DC/DC, Analog DC/DC, and AV8.

The Advantest T5801 is a memory test system capable of testing ultra-high-speed DRAM devices.

The Teradyne / Nextest Magnum II EV 128 is a tester.

The Advantest T2000 AiR2X is an air-cooled SoC and power analog test solution unveiled by Advantest.

The Multitest MT 9510 STD is a handler described with temperature and high-voltage capabilities.

The Cohu / Delta Design 1688 ES Ambient is a test handler for semiconductor testing.

The V93000 EXA Scale is an Advantest SoC test system described as a leading-edge semiconductor test solution for next-generation SoCs.

The Multitest 9928 is a handler used in semiconductor test and probe operations.

The Signatone WL-1160 is an RF/microwave probe station designed for high-frequency, high-power, and millimeter-wave applications.

The Advantest T 6581 T Digital Meter is a digital meter manufactured by Advantest.

The Advantest M 6242 is a handler for BGA, CSP, and TSOP 1 target packages.

The Micromanipulator 8060 Wafer is a test and probe wafer prober for 8-inch wafers.

The Cascade Microtech Summit 12000 is a probe station or prober for semiconductor wafer testing.

The Esec 2008 is a handler manufactured by Esec, listed in the Test & Probe equipment category.

The Advantest T 5585 is a tester in the Test & Probe category.

The Tel P 8 XL Automatic Wafer Prober is an automatic wafer prober manufactured by Tel.

The P 8 XLm is a wafer prober manufactured by Tokyo Electron.