Test & Probe

The Agilent 11729C Carrier Noise Test Set is an integral part of a phase noise measurement system, capable of up-converting, down-converting, and phase/frequency demodulation.

The KLA 1007 is a wafer prober manufactured by KLA.

The Cascade Microtech 103-754 is an x-y-z-θ probe positioner used in the HFTL 50-GHz Small-Signal Probe Station.

The Electroglas 2001 CX Automatic Wafer Prober is an automatic wafer prober designed for wafer test and sort.

The Keysight N2803A is a 30 GHz probe amplifier from the InfiniiMax III series.

The Chroma 58212 CLED Mapping Prober is a mapping prober.

The Chroma 58173 LED Chip Level Tester is a 6-inch test system used for LED chip-level testing.

The ASM AS 899 is a test and sort machine.

The Thermo Scientific Orion 3-Star is a benchtop/portable meter for pH and conductivity measurements, featuring a backlit LCD, multiple calibration options, and data logging.

The LTX / Credence D 10 is a tester used in semiconductor manufacturing.

The Advantest T5593 is a memory ATE system designed for testing DDR2 SDRAM and other high-speed memory devices, capable of handling up to 256 devices.

The LTX / Credence Fusion MX is a tester system manufactured by LTX/Credence.

The Advantest T5501 is a memory test system for high-bandwidth devices such as GDDR3/4-SDRAM, SRAM, and DDR3-SDRAM.

The Keysight / Agilent 4062 UX is a parametric tester.

The Seiko Epson NS 6040 is a high-speed IC handler that automatically transports semiconductor devices and classifies them according to inspection results.

The Teradyne/Eagle ASM 2160 is a final test system for electronic components and printed circuit boards, compatible with the Teradyne Eagle ETS 364 tester.

The Teradyne A 300 is a tester.

The Advantest 93000 PS 800 LTH is a tester with 768 channels.

The Advantest MPT 3000 ENV is a Gen 4 tester used for semiconductor testing.

The Keysight / Agilent 4072 B is a tester identified with the make Keysight / Agilent and model designation 4072 B.

The Teradyne / Nextest Magnum V EV is a tester.

The Electroglas 2001X is an automatic wafer prober used for semiconductor wafer probing, parametric test, and device characterization.

The Keysight/Agilent 4073A is a parametric tester.

The Cascade Microtech Summit 11000 is a manual wafer prober for 200mm wafers used in DC and RF device characterization.

The PS 1600 Smartscale is a semiconductor test system from Advantest/Agilent/HP/Verigy, introduced in 2012 and including components such as PS 1600 modules, DPS 32, and a Compact Test Head.

The Advantest V 93000 SOC Series is a system-on-chip (SOC) test system with a variety of testhead boards including PS800, Clock, MSDPS, Digital DC/DC, Analog DC/DC, and AV8.

The Teradyne / Nextest Magnum II EV 128 is a tester.

The Signatone WL-1160 is an RF/microwave probe station designed for high-frequency, high-power, and millimeter-wave applications.

The Electroglas EG 4090 u is an automatic wafer prober.

The KLA Inspex Eagle Tester is a wafer handling and inspection system with 6-inch chuck and prealigner, 4-inch to 8-inch wafer capability, cassette-to-cassette handling, two ports, and a Zeiss microscope.

The Precio series is a fully automatic wafer-probing platform from Tokyo Electron Limited.

The Agilent E8364B is a PNA network analyzer. The Agilent E8364B is a microwave network analyzer with a 10 MHz to 50 GHz frequency range.

The Tektronix P 6248 is a prober.

The Nordson / Dage BT 22 Bond Pull & Shear Tester is a bond test instrument that evaluates the mechanical strength of wire bonds, solder joints, and other microelectronic connections.

The MPI TS150 Probe Station is designed for electrical testing on wafers or chips and supports wafers up to 6 inch.

The Cascade Microtech R 6100 is a probe system described as an 8-inch prober with a thermal chuck, X/Y/Z/θ servos, and a vibration-damping table with a dark hood.