Comparison ledger
LTX-Credence TMT ASL 1000 165, Teradyne J 750, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | TMT ASL 1000 165LTX-Credence | J 750Teradyne |
|---|---|---|
| OEM | LTX-Credence | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | Windows XP SP3 |
| Generation | — | — |
| Family | LTX-Credence TMT ASL 1000 165 | Teradyne J 750 |
| Specifications | ||
| Configuration | With Electroglas 4090[2] | 512 Pins[4] |
| Type | IC tester[2] | — |
| Make | LTX / Credence[2] | Teradyne[4] |
| Model | TMT ASL 1000 165[2] | J 750[4] |
| Associated equipment | Electroglas 4090[2] | — |
| Board set | Standard board set with gold[2] | — |
| Vintage | 2011[2] | — |
| Wafer handling | 8" Hot Chuck[2] | — |
| Board | — | Channel[4] |
| PN | — | 239-001-04 1 ed 182 0945-D 5445[4] |
| Computer OS Version | — | Windows XP SP3[5] |
| IG-XL Version | — | 3.50.40[5] |
| Phase | — | 3 Phase[6] |
| Voltage | — | 208 VAC, 30 A, 50/60 Hz[9] |
| Borad | — | CUB[4] |
| Pin count | — | 512 pins[4] |
| Electrical input | — | 3 Phase - 3 Wire + PE - 50/60 Hz - 30 A, 208 Vac[6] |
| Application context | — | wafer-form integrated circuit testing[10] |
| Probe-station docking | — | A-type configuration[10] |
| Software version | — | IG-XL Version 3.50.40[5] |
| Power | — | 3 Phase - 3 Wire + PE - 50/60 Hz - 30 A, 208 Vac[6] |
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