LTX-Credence
TMT ASL 1000 165
What is it?
What do the numbers mean?
Wafer handling1
- 8" Hot Chuck[1]
Configuration & options3
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Teradyne J 750— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Teradyne ETS 364— Same function class: Test & Probe, UnknownCompare in depthsource[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the TMT ASL 1000 165 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the TMT ASL 1000 165 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the TMT ASL 1000 165 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the TMT ASL 1000 165 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the TMT ASL 1000 165 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the TMT ASL 1000 165 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]inventory listing
Last updated Jul 29, 2026.
Compare with similar tools
View all →
General referenceThe Advantest 93000 Smart Scale is a test and probe system used in semiconductor device evaluation and sorting. Machines of this class are used to contact device sites, apply test conditions, and record electrical responses for production screening and characterization.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
General referenceTeradyne ETS 364 is a test and probe system used to electrically evaluate semiconductor devices. Machines of this class combine probe contact, signal handling, and automated test control for device characterization and screening.
General referenceTeradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.