LTX-Credence
TMT ASL 1000 165
What it is
How it works
General reference — not yet source-verifiedAutomated test equipment applies electrical stimuli to device terminals and measures the resulting responses. Test systems of this class use pin electronics, pattern generation, timing control, and measurement resources to check whether a device behaves within its intended limits. Test systems of this class interface to the device through probing hardware for wafer level contact or through package level contact hardware for finished parts.
Where it fits in the process flow
Applications
General reference — not yet source-verifiedIC testers are used to verify electrical behavior of integrated circuits. Equipment in this class supports production screening, device characterization, engineering validation, and yield analysis through electrical measurement and functional checking.
What do the numbers mean?
Wafer handling2
- 8" Hot Chuck[1]
Configuration & options10
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Teradyne J 750— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Teradyne ETS 364— Same function class: Test & Probe, UnknownCompare in depthsource[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the TMT ASL 1000 165 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the TMT ASL 1000 165 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the TMT ASL 1000 165 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the TMT ASL 1000 165 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the TMT ASL 1000 165 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the TMT ASL 1000 165 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]inventory listing
- [4]LTX-Credence TMT ASL 1000 165 family | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 21, 2026.
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The Advantest 93000 Smart Scale Tester is a semiconductor test system that includes a Z640 workstation and can be configured with STH or CTH thermal heads and various card types.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
The Teradyne / Eagle ETS 364 Tester is a semiconductor test system with configurable analog and digital pin units.
General referenceTeradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.
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