Waferpedia

Comparison ledger

CrossBeam 550 versus sem2

Zeiss CrossBeam 550 and Zeiss sem2, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
sem2Zeiss
OEMZeissZeiss
CategoryMetrology & InspectionMetrology & Inspection
Wafer size200mm
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control systemWindows
Generation
FamilyZeiss CrossBeam 550Zeiss sem2
Specifications
ColumnGEMINI II electron optical column[1]
Stage5-axes motorized stage (X, Y, Z (M), Tilt and Rotation)[1]
AirlockSemi-automatic airlock[1]
Vibration compensationActive suspensions to compensate for vibrations[1]
Control softwareZeiss SmartSEM software[1]
Control interfaceControlled via a dual joystick and a dedicated control panel; PC with two monitors[1]
DetectorInLens SE detector[1]
Available software for offline analysis and metrologyProSEM software, MountainsMap 8.2 (coupled to 3DSM Metrology), SmartStitch[1]
Reserved useExclusively reserved for imaging dedicated to control of processes done in CMi by regular CMi users[1]
Sample holdersCarousel 9x10mm, multi-pin holder, Wafer Section, 4 Inch Wafer, 6 Inch Wafer, 6 Inch Mask[1]
OEMZeiss[2]
Modelsem2[2]
Equipment nameZeiss 200 mm Scanning Electron Microscope[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]epfl.chepfl.ch
  2. [2]nanolab.berkeley.edunanolab.berkeley.edu