Comparison ledger
Zeiss sem2 and Zeiss Supra 55, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | sem2Zeiss | Supra 55Zeiss |
|---|---|---|
| OEM | Zeiss | Zeiss |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | 200mm | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Zeiss sem2 | Zeiss Supra 55 |
| Cited variants | — | |
| Specifications | ||
| OEM | Zeiss[3] | — |
| Model | sem2[3] | — |
| Equipment name | Zeiss 200 mm Scanning Electron Microscope[3] | — |
| Configuration | — | Detectors:[4] |
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