Comparison ledger
AccoTest STS 8200, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | STS 8200AccoTest | 1007KLA |
|---|---|---|
| OEM | AccoTest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | AccoTest STS 8200 | KLA 1007 |
| Specifications | ||
| Make | AccoTest[1] | KLA[4] |
| Model | STS 8200[1] | 1007[3] |
| Configuration | Twin, dual-cage test system[1] | — |
| Instrument configuration | Identical A-side / B-side instrument configuration[1] | — |
| Installed instrument boards | 26 installed instrument boards (13 per cage)[1] | — |
| Floating source modules | FOVI Floating Source Modules (40V / 100mA / 1A pulsed)[1] | — |
| Floating power modules | FPV110 Plus Floating Power Modules (100V / 10A pulsed)[1] | — |
| Voltage meter | QVM Quad Voltage Meter (18-bit)[1] | — |
| Timing measurement unit | QTMU Plus II Quad Timing Measurement Unit[1] | — |
| Digital I/O | DIO 2.0 Plus Digital I/O (8-channel, 5 MHz, 1M vector memory)[1] | — |
| Control bit module | Cbit128 Control Bit Module[1] | — |
| Product type | Analog and Power Test System[2] | — |
| Mainframe slots | 26 universal slots[2] | — |
| Manufacturer | — | KLA[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Equipment type | — | Prober[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →