Comparison ledger
Accretech UF 3000 LX Automatic Wafer, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | UF 3000 LX Automatic WaferAccretech | 1007KLA |
|---|---|---|
| OEM | Accretech | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | Wafer I.D Reading | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech UF 3000 | KLA 1007 |
| Specifications | ||
| Configuration | Room/hot chuck[1] | — |
| Wafer size | Wafer I.D Reading[2] | 150 mm[4] |
| OEM | Accretech / TSK[1] | — |
| Model | UF 3000 LX[1] | 1007[4] |
| Equipment type | Automatic Wafer Prober[1] | Prober[5] |
| Category | Test & Probe[3] | — |
| Wafer I.D Reading | Wafer I.D Reading[3] | — |
| Probe Pad Auto Alignment | Probe Pad Auto Alignment[3] | — |
| Probe Mark Inspection | Probe Mark Inspection[2] | — |
| Needle Cleaning Unit | Needle Cleaning Unit[2] | — |
| Special function | Accepting 25 slot cassette[2] | — |
| GP-IB I/F | GP-IB I/F[2] | — |
| Test Head Check Function | Needle align interlock[2] | — |
| SAPC | SAPC[2] | — |
| Dual Temp | Room ~ Hot[2] | — |
| Motorized Test Head docking Kit | For ND4[2] | — |
| Room/hot chuck | Room/hot chuck[1] | — |
| V93K docking | V93K docking[1] | — |
| Manufacturer | — | KLA[4] |
| Description | — | Wafer Prober[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
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