Accretech

UF 3000 LX Automatic Wafer

Test & Probe Wafer I.D Reading Accretech UF 3000 family

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UF 3000 LX Automatic Wafer — Inventory photo — Fig. 01UF 3000 LX Automatic WaferInventory photo^[1]

Plate 01UF3000 ACCRETECH/TSK Wafer Prober System
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Plate 02UF3000 TSK/ACCRETECH Wafer Prober System
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Wafer size

Wafer I.D Reading

Performance

Probe Pad Auto Alignment^[1]

What it is

The Accretech UF 3000 LX Automatic Wafer is an automatic wafer prober used in test and probe work.^[3]^[1]^[4]

How it works

The UF 3000 LX Automatic Wafer supports probe pad auto alignment and wafer I.D. reading.^[1]^[4]

The UF 3000 LX Automatic Wafer includes a needle cleaning unit, a test head check function with needle align interlock, and a motorized test head docking kit for ND4.^[1]^[4]

Where it fits in the process flow

The UF 3000 LX Automatic Wafer supports a room or hot chuck, dual temperature operation from room to hot, and a special function for accepting a 25 slot cassette.^[1]^[4]

Applications

General reference — not yet source-verified

The UF 3000 LX Automatic Wafer is used for wafer-level electrical test on semiconductor devices.

What do the numbers mean?

Wafer handling7

Room/hot chuck^[3]; Special Function for accepting 25 slot cassette^[1]
Wafer size: Wafer I.D Reading^[1]
Equipment type: Automatic Wafer Prober^[3]
Wafer I.D Reading: Wafer I.D Reading^[4]
Special function: Accepting 25 slot cassette^[1]
Room/hot chuck: Room/hot chuck^[3]

Performance2

Probe Pad Auto Alignment^[1]
Probe Pad Auto Alignment: Probe Pad Auto Alignment^[4]

Configuration & options19

V93K docking^[3]; Probe Mark Inspection^[1]; Needle Cleaning Unit^[1]; GP-IB I/F^[1]; Test Head Check Function (Needle align interlock)^[1]; SAPC^[1]; Dual Temp (Room ~ Hot)^[1]; Motorized Test Head docking Kit for ND4^[1]
OEM: Accretech / TSK^[3]
Model: UF 3000 LX^[3]
Category: Test & Probe^[4]
Probe Mark Inspection: Probe Mark Inspection^[1]
Needle Cleaning Unit: Needle Cleaning Unit^[1]
GP-IB I/F: GP-IB I/F^[1]
Test Head Check Function: Needle align interlock^[1]
SAPC: SAPC^[1]
Dual Temp: Room ~ Hot^[1]
Motorized Test Head docking Kit: For ND4^[1]
V93K docking: V93K docking^[3]

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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What type of equipment is the UF 3000 LX Automatic Wafer?

The UF 3000 LX Automatic Wafer is an automatic wafer prober used in test and probe work.^[3]^[1]^[4]

Not publicly documented

The following facts about the UF 3000 LX Automatic Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the UF 3000 LX Automatic Wafer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the UF 3000 LX Automatic Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the UF 3000 LX Automatic Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the UF 3000 LX Automatic Wafer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the UF 3000 LX Automatic Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report