Comparison ledger
Advantest V93000 EXA Scale, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V93000 EXA ScaleAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V93000 EXA Scale | KLA 1007 |
| Specifications | ||
| OEM | Advantest[1] | — |
| Model | V93000 EXA Scale[1] | 1007[3] |
| Product line | SoC Test Systems[1] | — |
| Description | A leading-edge semiconductor test solution that addresses the test technology challenges of next-generation SoCs[1] | Wafer Prober[3] |
| Product type | SoC Test System[2] | — |
| Target devices | advanced digital ICs up to the exascale performance class[2] | — |
| Architecture | proven V93000 architecture[2] | — |
| Test-head technology | Xtreme Link technology[2] | — |
| Digital and power supply cards | EXA Scale universal digital and power supply cards[2] | — |
| Compatibility | existing V93000 load boards and Smart Scale cards are compatible[2] | — |
| Software | SmarTest software[2] | — |
| Manufacturer | — | KLA[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →