Comparison ledger
Cohu Rasco SO1000, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Rasco SO1000Cohu | 1007KLA |
|---|---|---|
| OEM | Cohu | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cohu Rasco SO1000 | KLA 1007 |
| Specifications | ||
| OEM | Cohu[1] | — |
| Model | Rasco SO1000[1] | 1007[3] |
| Category | Test and Scan[1] | — |
| Type | Gravity test handler[2] | — |
| Handler style | Tube-to-tube[2] | — |
| Package support | Small SOIC, SSOP, TSSOP, MSOP, and SOT packages[2] | — |
| Site configuration | Single, dual, and quad configurations[2] | — |
| Test sites | 4 test sites[2] | — |
| Throughput | Up to 14,000 UPH[2] | — |
| Index time | Down to 500 ms[2] | — |
| Temperature range | Full tri-temp range -60°C to +175°C[2] | — |
| Temperature accuracy | +/- 2°C[2] | — |
| Package size range | MSOP 118 mil to SO 430 mil; QFN 3 mm to 12 mm[2] | — |
| Automation platform | PAICe Digital Twin Platform[2] | — |
| Manufacturer | — | KLA[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →