Rasco SO1000

Test handlers are semiconductor back-end machines that present packaged devices to electrical test equipment in a controlled sequence. Gravity handlers use guided part movement and indexing hardware to move singulated packages from input media through a test contact position and then toward output sorting paths. Test handlers sit around the electrical test stage rather than around wafer fabrication steps.

The Cohu Rasco SO1000 is designed to handle small SOIC, SSOP, TSSOP, MSOP, and SOT packages. The Cohu Rasco SO1000 supports dual-site and quad-site configurations, and the machine can also operate in a direct plunge-to-board arrangement. The Cohu Rasco SO1000 uses tube input and output, with quick adjustment and four manual outputs. The Cohu Rasco SO1000 features a fast plunger with up to four plunger heads. The Cohu Rasco SO1000 is available in single, dual, and quad configurations.^[1]

The Cohu Rasco SO1000 is specified for up to 14000 UPH. The Cohu Rasco SO1000 is specified with index time down to 500 ms. The Cohu Rasco SO1000 supports package sizes from MSOP 118 mil to SO 430 mil. The Cohu Rasco SO1000 also supports QFN sizes from 3 mm to 12 mm. The Cohu Rasco SO1000 supports a tri-temp range from -60°C to +175°C with temperature accuracy of +/- 2°C. The Cohu Rasco SO1000 offers multiple MEMS stimuli. The Cohu Rasco SO1000 also includes software analytics options through the PAICe Digital Twin Platform for real-time equipment monitoring, management, preventative maintenance, central recipe management, and unified reports.^[1]

Test handlers are used after wafer processing, assembly, and singulation, when devices have already been packaged into discrete units. Test handlers sit with automated test equipment in semiconductor back-end operations and support electrical screening, characterization, and production test on packaged parts. Test handlers commonly connect upstream to package loading media and downstream to sorting, retest, marking, or packing flows.