Comparison ledger
Electroglas 1034, Seiko Epson NS 8080, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1034Electroglas | NS 8080Seiko Epson |
|---|---|---|
| OEM | Electroglas | Seiko Epson |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas 1034 | Seiko Epson NS 8080 |
| Specifications | ||
| Configuration | — | Up to 8 sites testing capability[1] |
| Make | — | Seiko / Epson[1] |
| Model | — | NS 8080[1] |
| Machine type | — | Handler[1] |
| Category | — | Test & Probe[2] |
| Testing capability | — | Up to 8 sites[1] |
| Testing area | — | 264 mm x 149 mm[1] |
| Contact force | — | Up to 240 kgf[1] |
| UPH | — | Up to 13,500 ambient; up to 8,200 high temperature[1] |
| Vintage | — | 2010[1] |
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