Comparison ledger
Keysight 4145 B Semiconductor Parameter Analyzer, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | Keysight | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight 41xx | KLA 1007 |
| Specifications | ||
| Configuration | Fully automatic, high-speed dc characterization of semiconductor devices[1] | — |
| Manufacturer | Keysight / Agilent[1] | KLA[4] |
| Model | 4145 B[1] | 1007[4] |
| Instrument type | Semiconductor Parameter Analyzer[1] | — |
| Mode | Fully automatic[1] | — |
| Function | High-speed DC characterization of semiconductor devices[1] | — |
| Sourcing and measurement | High resolution, wide range sourcing and measurement[2] | — |
| Measurement and display points | Maximum 1150[1] | — |
| Analysis functions | Flexible graphic analysis functions for quick parameter extraction[1] | — |
| Storage / drive | Built-in micro flexible disc drive[1] | — |
| Sourcing and measurement range | 50 fA to 100 mA and 1 mV to 100 V[3] | — |
| Program storage | Floppy disk drive stores 240 user programs or 105 measurement results[3] | — |
| Family | Keysight 41xx family[2] | — |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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