Comparison ledger
KLA 0035235-003 MMD Head, Nikon Eclipse L 200, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Eclipse L 200Nikon | |
|---|---|---|
| OEM | KLA | Nikon |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 0035235-003 MMD Head | Nikon Eclipse L 200 |
| Cited variants | — |
|
| Specifications | ||
| Configuration | TSTD PCB ASSY, MMD MEAS HEAD[2] | Unable to test, sold As-Is[3] |
| Model | 0035235-003[2] | Eclipse L 200[3] |
| Make | KLA[2] | — |
| Part Description | TSTD PCB ASSY, MMD MEAS HEAD[2] | — |
| Compatible System | KLA AIT-XP[2] | — |
| OEM | — | Nikon[3] |
| Tool family | — | Nikon Eclipse L 200 ND[1] |
| Tool type | — | IC inspection microscope[1] |
| Wafer support | — | 6-inch wafer support[1] |
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