Comparison ledger
KLA 1007, Seiko Epson NS 8080, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | NS 8080Seiko Epson |
|---|---|---|
| OEM | KLA | Seiko Epson |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Seiko Epson NS 8080 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | NS 8080[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2010[3] |
| Make | KLA[2] | Seiko / Epson[3] |
| Equipment type | Prober[2] | — |
| Configuration | — | Up to 8 sites testing capability[3] |
| Machine type | — | Handler[3] |
| Category | — | Test & Probe[4] |
| Testing capability | — | Up to 8 sites[3] |
| Testing area | — | 264 mm x 149 mm[3] |
| Contact force | — | Up to 240 kgf[3] |
| UPH | — | Up to 13,500 ambient; up to 8,200 high temperature[3] |
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