Comparison ledger
KLA 1007, Seiko Epson NX 1016 MT, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | NX 1016 MTSeiko Epson |
|---|---|---|
| OEM | KLA | Seiko Epson |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Seiko Epson NX 1016 MT |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | NX 1016 MT[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2013[3] |
| Make | KLA[2] | Seiko / Epson[3] |
| Equipment type | Prober[2] | Handler[3] |
| Configuration | — | 200-240 VAC[3] |
| Voltage | — | 200-240 VAC[4] |
| Phase | — | Single phase[4] |
| Frequency | — | 50/60 Hz[4] |
| Vintage (documented unit) | — | 2013[3] |
| Power | — | 200-240 VAC[3] |
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