Comparison ledger
KLA .204 PSL Wafer, Malvern Panalytical NS300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NS300Malvern Panalytical | |
|---|---|---|
| OEM | KLA | Malvern Panalytical |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | Malvern Panalytical NS300 |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer Size | 8 inch[2] | — |
| Traceability | NIST[3] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[2] | — |
| Compatible tools | Surfscan 6xy0 and Sp1 particle counters[2] | — |
| Measurement technique | — | Nanoparticle Tracking Analysis (NTA)[4] |
| Particle size range | — | 30 to 800 nm[4] |
| Particle concentration range | — | 10^6 to 10^9 particles/mL[4] |
| Laser wavelength | — | 532 nm[4] |
| Temperature range | — | 20 to 50 C[4] |
| Sample volume required | — | ~1 mL[4] |
| Microscope magnification | — | 20X[4] |
| Camera frame rate | — | 30 frames per second[4] |
| Analysis range | — | 30 to 800 nm[4] |
| Nanoparticle tracking analysis range | — | 10 nm to 2000 nm, depending on instrument configuration and sample type[6] |
| Camera | — | 20X magnification microscope and camera; camera takes 30 frames per second[4] |
| Laser class | — | Class 1 laser device; contains a Class 3B laser inside the laser module[6] |
| Temperature control | — | Fully programmable using the NTA software[6] |
| Laser modules | — | Interchangeable laser modules[5] |
| Filter wheel | — | Motorized 6-position filter wheel[5] |
| Camera type | — | High sensitivity sCMOS camera[8] |
| Power input | — | 100-240V, 50/60Hz[8] |
| Interface | — | USB 2.0 input/output; Firewire B output[8] |
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