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Comparison ledger

Puma 9120 DefectversusStereoscan 440

KLA Puma 9120 Defect, KLA Stereoscan 440, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA Puma 9120KLA Stereoscan 440
Specifications
ConfigurationUser Interface Software Version 9.3.309.2.8[1]Burned out filament[4]
User Interface Software Version9.3.309.2.8[2]—
Operating SystemWindows 2000[2]—
Load Port Quantity2[2]—
Wavelength Illumination370~720 nm[2]—
Wavelength BandVisible, UV[2]—
Pixel Sizes0.16μm, 0.20μm, 0.25μm, 0.39μm, 0.62μm[2]—
Array Defect Capture Rate≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[2]—
Array False Defect Rate≤1.5% (all sizes)[2]—
Random Defect Capture Rate≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[2]—
Random False Defect Rate≤1.5% (all sizes)[2]—
Repeatability≥90% (20 consecutive run on the same DSW wafer)[2]—
Number of Inspection Pixel Models3[3]—
Pixel Sizes (sLXX) Installed or AvailablesL5, sL8, sL20[3]—
Cameras2[3]—
Loader TypeDual open cassette loader[3]—
Software Options: Array Mode AlgorithmYes[3]—
Software Options: SizingYes[3]—
Software Options: 9.1 SimulatorYes[3]—
Software Options: RICO CapableNo[3]—
Wafer Sizes200 mm (8 in), 300 mm (12 in)[3]—
OEMKLA[1]—
ModelPuma 9120[1]Stereoscan 440[4]
CategoryMetrology & Inspection[2]Metrology & Inspection[5]
Number of Cameras2[3]—
Manufacturer—KLA[5]
Tool type—Scanning electron microscope (SEM)[5]
Known failure mode—Burned out filament[5]

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Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]conationtech.comconationtech.com
  4. [4]inventory listing
  5. [5]waferpedia.comwaferpedia.com