Comparison ledger
Rigaku MiniFlex, Rigaku MiniFlex II Benchtop, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MiniFlexRigaku | MiniFlex II BenchtopRigaku |
|---|---|---|
| OEM | Rigaku | Rigaku |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | 1973– | — |
| Lifecycle | — | — |
| Lifecycle milestones | 2017 6th generation introduction | — |
| Control system | — | — |
| Generation | — | — |
| Family | Rigaku MiniFlex | Rigaku MiniFlex |
| Cited variants | — | |
| Specifications | ||
| Configuration | Refurbished[2] | 50/60 Hz[4] |
| X-ray power (Miniflex+) | 450 watts at 30 kV and 15 mA[1] | — |
| Tube power (MiniFlex600) | 600 W[1] | — |
| Sample changer | 6-position automatic sample changer[1] | Automated six sample changer[5] |
| Sample changer (6th generation) | 8-position automatic sample changer[1] | — |
| Detector (Miniflex II) | 1D silicon strip detector[1] | — |
| Detector (6th generation) | 2D hybrid pixel array detector (HPAD)[1] | — |
| Source (Miniflex II) | Monochromatic X-ray source[1] | — |
| Goniometer (original and 2nd generation) | Horizontal goniometer[1] | — |
| Goniometer (Miniflex+ and current generation) | Vertical goniometer[1] | — |
| Data output (original and 2nd generation) | Internal strip chart recorder[1] | — |
| Sample spinning (MiniFlex 600) | Sample spinning capability[3] | — |
| Software (MiniFlex600) | New PDXL powder diffraction software[1] | — |
| Software (6th generation) | Updated SmartLab Studio II software with fundamental parameter method (FP), phase identification using the Crystallography Open Database (COD), and a wizard for ab initio crystal structure analysis[1] | — |
| Type | X-ray Diffraction (XRD) Analytical Measuring Instrument[1] | — |
| Form Factor | Benchtop (tabletop)[1] | — |
| Power (MiniFlex+) | 450 watts, operating at 30kV and 15mA[1] | — |
| Power (MiniFlex600) | 600W[1] | — |
| Sample Changer (MiniFlex+ and later) | 6-position automatic sample changer[1] | — |
| Sample Changer (6th gen) | 8-position automatic sample changer[1] | — |
| Detector (6th gen) | 2D hybrid pixel array detector (HPAD)[1] | — |
| Instrument type | X-ray diffractometer / X-ray diffraction (XRD) analytical measuring instrument[2] | — |
| Form factor | Compact benchtop X-ray diffraction system[3] | — |
| Capabilities | Identification of crystalline phases, crystallinity, crystallite size, and crystal structure determination[3] | — |
| Sample handling | Automated 6 position sample changer with sample spinning capability[3] | — |
| Historical note | First commercial benchtop (tabletop) X-ray diffraction instrument[1] | — |
| Tool type | — | Benchtop X-ray diffractometer[4] |
| Power | — | 50/60 Hz[4] |
| Electrical input | — | 100/115 Vac[4] |
| Measurement applications | — | Diffraction pattern comparison of polycrystalline materials such as powder samples and metal plates; qualitative and quantitative analyses; quality management of raw materials and products[5] |
| Monochromator option | — | Monochromator addition that captures X-rays other than Cu Kα[5] |
| Goniometer type | — | Vertical[5] |
| Goniometer radius | — | 150 mm[5] |
| Scanning axis | — | θ/2θ interlocked[5] |
| Detector scintillator | — | NaI (T1)[5] |
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