Rigaku
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X-ray diffractometers are analytical tools used outside the main patterning and etch sequence to examine material structure. X-ray diffractometers generally fit in characterization, failure analysis, research, and quality workflows where crystalline phase or structural information is needed from prepared samples. X-ray diffractometers are commonly used after film deposition, powder preparation, material synthesis, or other sample-forming steps, and before interpretation, comparison, or release decisions based on the measured diffraction pattern.
The Rigaku MiniFlex II can be used for diffraction pattern comparison of polycrystalline materials such as powder samples and metal plates. The Rigaku MiniFlex II can be used for qualitative and quantitative analyses and for quality management of raw materials and products.[2]
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the MiniFlex II Benchtop are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MiniFlex II Benchtop are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the MiniFlex II Benchtop are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MiniFlex II Benchtop are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MiniFlex II Benchtop are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MiniFlex II Benchtop is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 18, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.