Waferpedia

Tool family

KLA MicroSense

KLA2 entries

Models in this family

  1. The KLA / ADE MicroSense 6300 is a wafer tester.

  2. The KLA / MicroSense UMSC 200 BT Measurement System is a non-contact measurement system for flatness and thickness measurement.

All entries

  1. MicroSense 6300 WaferKLA

    The KLA / ADE MicroSense 6300 is a wafer tester.

    CategoryTest & Probe
    1 spec
  2. MicroSense UMSC 200 BT MeasurementKLA

    The KLA / MicroSense UMSC 200 BT Measurement System is a non-contact measurement system for flatness and thickness measurement.

    CategoryMetrology & Inspection
    20 specs