KLA

The KLA eS 32 is an E-Beam Inspection System.

The KLA 200 series is a pattern inspection station used for reticle and photomask inspection.

The KLA FT-750 is a visible light spectrophotometer-based thin film measurement system for semiconductor process control.

The KLA AlphaStep D-300 is a stylus-based surface profiler that measures step heights from 50 nm to 300 µm.

KLA F 60 is a film thickness measurement tool used in semiconductor metrology and inspection.

The KLA 1.112 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 inspection systems.

The KLA SLF 17 is an inspection system.

KLA Candela CS 2 Surface is a metrology and inspection tool described as a surface inspection system and surface analyzer.

The KLA Archer 300 is an overlay metrology system for optical overlay measurements on 300mm wafers.

The KLA 8100 XP is a critical dimension scanning electron microscope (CD-SEM) designed for automated CD measurements on silicon wafers and reticles, featuring production-proven electron optics for bottom imaging of high aspect ratio structures.

The KLA Surfscan SP 1 is a wafer inspection tool from KLA-Tencor used for defect detection and surface quality inspection on polished wafers, epi wafers, and engineered substrates.

The KLA Alpha Step D 500 Wafer Profiler Meter is a stylus profiler for 2D step height measurement, roughness, bow, and stress metrology.

KLA Surfscan 6 XY 0 Training is an equipment entry identified by model Surfscan 6 XY 0.

The KLA CS 20 R Surface Analyzer is a surface analysis tool used in semiconductor manufacturing.

The KLA Flexus F 2320 I is a stress measurement system for semiconductor wafers that supports 6-inch and 8-inch wafers and uses dual wavelength measurement.

The KLA Inspex Eagle Tester is a wafer handling and inspection system with 6-inch chuck and prealigner, 4-inch to 8-inch wafer capability, cassette-to-cassette handling, two ports, and a Zeiss microscope.

The KLA P 16 Surface is a surface profilometer described as a fully refurbished unit with Windows XP, extended range up to 1 mm, and a 3D option.

The KLA Surfscan SP 1 TBI Keyboard is a keyboard-only replacement part for the KLA Surfscan SP 1 TBI system.

The KLA Surfscan 7700 is a particle defect inspection system.

The KLA Candela CS 10 R Wafer Inspector is a single-phase wafer inspector with a 50/60 Hz, 5 A power specification and a booting upgrade requirement.

The KLA SCD 100 is a film thickness measurement tool.

The KLA 5100 Overlay Measurement System is an overlay measurement system with an 8-inch wafer size.

The KLA RS 75 Resistivity Mapper is a resistivity mapping tool for 8-inch wafers.

The KLA PCA 54.0294 Turret Servo Driver is a turret servo driver manufactured by KLA under the model designation PCA 54.0294.

The KLA Surfscan SP 1 DLS Particle Defect System is a wafer inspection tool cited in sources with 8-inch, 12-inch, and 300mm configurations.

The KLA SpectraCD 200 is a wafer inspection system.

The KLA P 20 H Profiler is a metrology and inspection tool categorized as a parts unit and part of the KLA P family.

The KLA Candela 8620 Surface is a surface inspection system in the Candela 8620 model line.

The KLA / Therma-wave OP 5220 is a film thickness measurement tool.

The KLA Candela CS 920 Surface Analyzer is a metrology and inspection tool that includes a PSC Calibration Wafer.

KLA P 16 + Profiler is a metrology and inspection tool with listed wafer sizes from 2 inch to 12 inch.

The Counterweight-50x-100xNikonDI is a KLA Instruments spare part listed in the KLA Instruments online store.

The KLA Candela 8520 Surface is a surface inspection system for wafer inspection on 6-inch and 8-inch wafers.

KLA 2213-75 TSLKTB Argon Laser is a refurbished argon laser compatible with KLA AIT II, AIT XP, and AIT XP+ systems.

The KLA CondWafer-4PP is a product listed in the KLA Instruments online store.

The KLA Surfscan SP 5 Particle Defect System is a bare wafer inspection station configured for 12-inch wafers.

The KLA Surfscan SP 3 Particle Defect System is a bare wafer inspection station for 12-inch wafers with DUV illumination.

The KLA OmniMap RS 75 Resistivity Mapper is a resistivity mapping tool.

KLA eV 300 is an advanced, fully automated scanning electron microscope defect review tool for manufacturing environment use.

The KLA-Tencor Omnimap RS55/TC is a semiconductor equipment manufactured by KLA-Tencor and supports 8-inch wafers.

The KLA 6XY0 PM Service Agreement is a preventive maintenance service contract.

The KLA Aleris HX 8500 is an ellipsometry measurement tool introduced in 2008.

The KLA 6220 is a particle inspection and bare wafer surface defect inspection system.

The KLA 1007 is a wafer prober manufactured by KLA.

The KLA / MicroSense UMSC 200 BT Measurement System is a non-contact measurement system for flatness and thickness measurement.

The KLA 7600 Patterned Wafer Particle Defect is a metrology and inspection system configured for a 25 Wafer Slot Cassette.

The KLA TP 500 Implant Dosing Measurement is an ion implantation equipment model from KLA / Therma-Wave.

The KLA HRP 220 Surface is a surface profilometer.

The KLA OP 2690 Film Thickness Measurement System is a metrology tool for 8-inch wafers.

The KLA INS 2000 Macro Defect is a KLA / Leica metrology and inspection tool.

The KLA SpectraShape 9000 is a Critical Dimension (CD) measurement tool that supports 12-inch wafers.

The KLA FLX 2320 Stress Measurement is a stress measurement system that accommodates 8-inch wafers.

The KLA Puma 9120 is a dark-field defect detection tool for semiconductor wafer inspection. The KLA Puma 9120 is configured for 200 mm and 300 mm wafers and has two cameras.

The KLA ATL 150 i is an overlay measurement system designed for 12-inch wafers.