Tool family
The Nanometrics 210 is listed as a film thickness measurement tool and a scanning UV Nanospec/DUV microspectrophotometer in facility equipment inventories.
The Nanometrics 210 is a film thickness measurement system capable of measuring film thicknesses up to 50 micrometers (500,000 angstroms) with a typical measurement time of 2.5 seconds.
Cited variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Nanometrics 210 XP | — | — | Listed as a scanning UV Nanospec/DUV microspectrophotometer. | nanolab.berkeley.edu[1] |