Waferpedia

Manufacturer

View Engineering

12 entries

  1. 1200View Engineering

    VIEW 1200 was a binary image, machine vision-based coordinate-measuring machine introduced in 1982.

    Categorymachine vision-based CMM
  2. Bazic8View Engineering

    Bazic8 was a machine vision-based coordinate-measuring machine introduced by VIEW Engineering in 1988.

    CategoryMachine vision-based CMM
  3. PR-1View Engineering

    VIEW PR-1 was introduced in 1978 as a binary image, pattern recognition system for automated wirebonding machines and wafer probers.

    CategoryPackaging & Bonding
    Discontinued
  4. 1119View Engineering

    VIEW 1119 was introduced in 1982 as a combination of the VIEW 719 and VIEW 1101, providing pattern recognition and edge detection capabilities.

    Categorymachine vision system
    Legacy
  5. Bazic12View Engineering

    Bazic12 is a View Engineering machine vision-based coordinate-measuring machine introduced in 1988.

    CategoryMachine vision-based CMM
    Discontinued
  6. Ultra8View Engineering

    VIEW Ultra8 was introduced in 1989 as a high-accuracy, sub-micron machine vision-based CMM.

    Categorymachine vision-based coordinate-measuring machine
    Discontinued
  7. 719View Engineering

    VIEW 719 was a general-purpose, binary image, machine vision system for shop floor use, introduced in 1981.

    Categorygeneral-purpose machine vision system
    Discontinued
  8. 1220View Engineering

    VIEW 1220 is a 2nd generation grayscale image machine vision-based coordinate-measuring machine introduced in 1985.

    Categorymachine vision-based CMM
    Legacy
  9. 720View Engineering

    VIEW 720 was a second-generation general-purpose grayscale-image machine vision system for shop floor use, introduced in 1985.

    Categorymachine vision system
    Discontinued
  10. RB-1View Engineering

    The View Engineering RB-1 was introduced in 1977 as an automated, 3-axis, binary image, machine vision-based dimensional measurement system.

    Categorymachine vision-based dimensional measurement system
    Legacy
  11. 1101View Engineering

    The VIEW 1101 was a second-generation binary image pattern recognition system introduced in 1982 for automated wirebonding machines and wafer probers.

    CategoryPackaging & Bonding
    Legacy
  12. 725View Engineering

    VIEW 725 was a dedicated machine vision system introduced in 1986 for QFP and PLCC package inspection.

    CategoryMetrology & Inspection
    Discontinued