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Bruker

contour-R1

Precision OpticsBruker contour-R1 family
Research Quality: 30% complete

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Brukercontour-R1
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Vacuum

<0.1 nm[2]

Optics

Optical Profiler[1]

What it is

The Bruker Contour-R1 is an optical profiler designed for non-contact three-dimensional surface characterization.[3]

How it works

The system includes a motorized X-Y stage, a 150 mm maximum sample diameter, and a 100 mm maximum sample height. Objectives of 10× and 50× are mounted on a software-controlled turret, with field-of-view lenses of 0.55× and 2×. A stitching algorithm combines multiple images into a single larger area scan. The system is operated via the Vision64 software package.[2]

What do the numbers mean?

Vacuum & pumping2

Vertical resolution (PSI mode)
<0.1 nm[2]
Accurate?
Measurement modes
Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI)[2]
Accurate?

Optics & imaging5

Equipment type
Optical Profiler[1]
Accurate?
Measurement principle
Optical (non-contact) 3D surface characterization; uses interference microscopy[2]
Accurate?
Vertical resolution (VSI mode)
~3 nm[2]
Accurate?
Objectives
10X and 50X on a software controlled motorized turret[2]
Accurate?
Field of view (FOV) lens
0.55X and 2X[2]
Accurate?

Control & software1

Software
Vision64 for automation and analysis[2]
Accurate?

Dimensions & facilities1

Max. sample height
100 mm[2]
Accurate?

Configuration & options5

Equipment identifier
Inert-BRUKER-contour-R1[1]
Accurate?
Max. sample diameter
150 mm[2]
Accurate?
Max. single measurement area
1.0 mm x 1.0 mm (with stitching for larger areas)[2]
Accurate?
Stage type
Motorized X-Y stage[2]
Accurate?
Additional capabilities
Stitching algorithm for combining multiple images; handles rough surfaces, abrupt steps, slopes >60°, and low reflectance <0.5%[2]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Vertical resolution (PSI mode)<0.1 nm[2]
  • Measurement modesVertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI)[2]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Not publicly documented

The following facts about the contour-R1 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the contour-R1 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the contour-R1 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the contour-R1 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the contour-R1 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the contour-R1 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]uwaterloo.cauwaterloo.cauwaterloo.ca
  2. [2]uwaterloo.cauwaterloo.cauwaterloo.ca
  3. [3]RAC1 Bruker Contour Profiler [BRUKER-contour-R1] — Plone siteqnfcf.uwaterloo.caqnfcf.uwaterloo.ca
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Last updated Aug 13, 2026.

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