Bruker

The Bruker Contour R1 is a 3D optical metrology system used for non-contact surface characterization.

The Bruker B H 15 Controller is a Bruker controller identified by model B H 15.

The Bruker InSight 3 DAFM Photomask Atomic Force Microscope is a photomask atomic force microscope designed for 12-inch wafers.

The Bruker / Veeco Dimension Fastscan is an atomic force microscope with stated scan, noise, stage, optics, software, and AFM mode specifications.

Bruker Dimension Edge is an atomic force microscope (AFM) used for nanoscale surface topography and nanomechanical measurements.

The Bruker D 8 Discover Analytical is an X-ray diffractometer.

The Bruker / Veeco Dektak 150 is a contact stylus surface profiler designed for two-dimensional surface profile measurements in industrial and research applications.

The Bruker Contour GTX is a white light interferometer (WLI) used for optical surface metrology.

The Bruker D 8 Fabline is a fully automated X-ray diffractometer configured with wafer chuck and standard sample holder support.

The Bruker D 5000 is a diffractometer described with a Cu X-ray tube, graphite monochromator, and scintillation detector.

The Bruker / Jordan Valley JVX 5200 T is a film thickness measurement equipment model stated for 12-inch wafers.

The Bruker Dektak Pro-S is a stylus-based surface profiler for measuring surface topography and thin film step heights.

The Bruker P 4 Single Crystal is a single crystal X-ray diffractometer with a Cu X-ray tube, graphite monochromator, and scintillation detector.