Woollam
The Woollam M-2000V is an ellipsometry tool. The J.A. Woollam M2000V Ellipsometer is in the characterization process area at nanoFAB. The J.A. Woollam M-2000V Ellipsometer is located in CME L2-154.[1][4][3]
An ellipsometry tool measures how the polarization state of reflected light changes at a surface or through a thin film stack. Ellipsometry is used to infer film thickness and optical properties by fitting the measured polarization response to an optical model. Ellipsometry is a noncontact optical metrology method used for thin film characterization.
Ellipsometry is a characterization method used alongside thin film deposition and related materials analysis work. An ellipsometry tool is commonly used after a film is formed to check thickness or optical behavior, and the results can inform later process tuning or verification steps. Ellipsometry can support development and monitoring of deposition, etch, and multilayer film processes where optical film properties matter.
Ellipsometry is used for thin film characterization in research and microfabrication environments. An ellipsometry tool is commonly applied to measure film thickness, extract refractive behavior, and analyze layered surface coatings. Ellipsometry is useful for dielectric, semiconductor, and other optically responsive thin films when nondestructive optical metrology is needed.
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The following facts about the M-2000V are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the M-2000V are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the M-2000V are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the M-2000V are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the M-2000V are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the M-2000V is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 17, 2026.