5 entries
- M-2000DWoollam
The J.A. Woollam M-2000D Spectroscopic Ellipsometer is a fully automated measurement tool for optical properties of thin film semiconductor materials.
CategorySpectroscopic ellipsometerWafer8 in (190-1600 nm) - M-2000VWoollam
The Woollam M-2000V is an ellipsometry tool mentioned as part of nanoFAB’s materials analysis capabilities.
Categoryellipsometry - M-2000DIWoollam
The Woollam M-2000 Model DI is a variable-angle spectroscopic ellipsometer for non-destructive optical characterization of thin films.
CategoryEllipsometer - M-2000Woollam
The J.A. Woollam M-2000 is a spectroscopic ellipsometer for precise thin-film characterization.
CategoryMetrology & Inspection - M-2000UIWoollam
The Woollam M-2000UI is an ellipsometer for thin film thickness measurement.
CategoryMetrology & Inspection
