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Wyko

SP3200

Packaging & BondingWyko SP3200 family
Research Quality: 40% complete
SP3200 — web.archive.org
Fig. 01SP3200web.archive.org[1]

What is it?

The Wyko SP3200 Surface Profiler is described as an advanced packaging profiling system designed for in-line process monitoring of flip-chip packaging. It provides dual process control capabilities as both a surface metrology tool and a defect inspection tool, and it supports measurement and inspection functions for advanced packaging substrates.

What can it run?

Process applications and technology nodes documented for this tool.

  • In-line process monitoring of flip-chip packaging
  • Advanced packaging substrates

What do the numbers mean?

Control & software2

Application software
Wyko Vision32 analysis software[2]
Accurate?
Software features
Specialized algorithms, automation scripting language, integrated database, automatic data logging, and real-time go/no-go feedback[2]
Accurate?

Dimensions & facilities1

Surface metrology measurements
Calculates bump height, diameter, volume, and three-point and regression coplanarity[1]
Accurate?

Configuration & options4

System type
Gauge-capable surface profiler[1]
Accurate?
Functional roles
Surface metrology tool and defect inspection tool[1]
Accurate?
Defect inspection capabilities
Automatically detects solder bridges, under & oversized bumps, missing & extra solder bumps, and bump position[1]
Accurate?
Database function
Master database allows trending analysis over a product's lifecycle[2]
Accurate?
Interested in this tool?
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What replaced it?

  • siblingWyko SP3000Listed alongside the SP3200 in the product lineup.source[3]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Frequently asked questions

What is the Wyko SP3200 used for?

It is designed for in-line process monitoring of flip-chip packaging, combining surface metrology and defect inspection functions for advanced packaging substrates.[1]

What defects can the Wyko SP3200 detect?

It automatically detects solder bridges, under and oversized bumps, missing and extra solder bumps, and bump position.[1]

What measurements does the Wyko SP3200 calculate?

It calculates bump height, diameter, volume, and three-point and regression coplanarity.[1]

Not publicly documented

The following facts about the SP3200 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the SP3200 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the SP3200 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the SP3200 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the SP3200 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the SP3200 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.orgweb.archive.org
  2. [2]web.archive.orgweb.archive.orgweb.archive.org
  3. [3]Veeco Products - Show All Productsweb.archive.orgweb.archive.org
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Last updated Jul 29, 2026.

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