Zeiss
780
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
How it works
The Zeiss LSM 780 uses laser excitation and confocal detection for fluorescence imaging. The Zeiss LSM 780 is equipped with a 34 channel spectral array with laser lines at 405 nm, 458 nm, 488 nm, 514 nm, 561 nm, 594 nm, and 633 nm. The Zeiss LSM 780 has a 32 channel GaAsP detector for capturing spectral information for linear unmixing. The stage can be motorized for position marking and tiled imaging over areas larger than a single field of view. The Zeiss LSM 780 can also acquire and analyze fluorescence correlation spectroscopy data when used with the appropriate module and software environment.[2][3][5]
What do the numbers mean?
Optics & imaging6
Control & software1
Configuration & options9
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
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Frequently asked questions
What type of microscope is the Zeiss LSM 780?
The Zeiss LSM 780 is a multi-purpose, visible light confocal laser scanning microscope.[2]
Can the Zeiss LSM 780 perform fluorescence correlation spectroscopy?
The Zeiss LSM 780 can acquire and analyze fluorescence correlation spectroscopy data. The fluorescence correlation spectroscopy workflow can measure particle mobility, concentration, and interaction at a single molecule level.[5]
Not publicly documented
The following facts about the 780 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 780 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 780 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 780 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 780 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 780 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Sources & citations
Sources (5)Every fact above is drawn from these public sources
- [1]microscopy.duke.edu — microscopy.duke.edumicroscopy.duke.edu
- [2]bcm.edu — bcm.edubcm.edu
- [3]ohsu.edu — ohsu.eduohsu.edu
- [4]medschool.vanderbilt.edumedschool.vanderbilt.edu
- [5]https://www.zeiss.com/content/dam/rms/reference-master/service-support/downloads/faq/zen2010-lsm780_basic_fcs_experiments.pdf/_jcr_content/renditions/original./zen2010-lsm780_basic_fcs_experiments.pdf — zeiss.comzeiss.com
Last updated Oct 18, 2026.