Zeiss

The Zeiss LSM 880 is a laser scanning confocal microscope.

The ZEISS Axioscope 5 is a smart upright microscope designed for biomedical routine and research, featuring automatic digital documentation with a Snap button and support for multiple contrast techniques.

Zeiss 200 mm Scanning Electron Microscope.

Zeiss manufactures inverted metallurgical microscopes for reflected-light materials analysis, including the Axio Vert.A1 MET and Axiovert 100A models.

The Zeiss Surfcom 1900 SD is a surface roughness meter.

The Zeiss Jenapol is a microscope with a universal stage.

The Zeiss Ultra-55 SEM is used as the platform for Zyvex S-100 Nanoprobes.

The Zeiss ORION NanoFab is a focused ion beam microscope used for ultrahigh-resolution imaging, direct writing, and lithography, operating with either He or Ne beams.

The Zeiss LEO 1560 is a scanning electron microscope with a 6-inch stage and loadlock, Schottky field emission gun, and in-lens SE and E-T SE detectors.

Zeiss MERLIN is a scanning electron microscope at CMi reserved for imaging and process-control inspection, with support for imaging, EDX analysis, and offline analysis in ProSEM.

The Zeiss SEM Crossbeam 550 is a scanning electron microscope configured at CMi for imaging dedicated to process control and supported with metrology and analysis software.

The Carl Zeiss SteREO Lumar.V12 is a stereomicroscope designed for high-resolution fluorescence imaging with the largest specimen field in its class.

The Zeiss Sigma HDVP is a scanning electron microscope with an acceleration voltage of 0.02 kV to 30 kV and a magnification range of 10x to 1,000,000x.

Zeiss O Inspect 322 is a coordinate measuring machine in the O Inspect 322 model line.

Zeiss Sigma 300 VP FE-SEM is a field emission scanning electron microscope.

The Zeiss Axio Imager M 2 m is a microscope configured with controller and power supply, a granite stand, multiple objectives, laser autofocus, a camera, dark-bright-field cubes, and a motorized XYZ stage.

General referenceZeiss Supra 55 is a metrology and inspection instrument used for high-resolution examination of materials and device surfaces. It belongs to the class of electron microscope systems used to inspect fine structural detail that is difficult to resolve with conventional optical methods.

The Zeiss Supra 40 VP is a scanning electron microscope described as a SEM with a Coolstage, Thermofisher EDS, and a transmitted detector issue noted.

The Carl Zeiss 1540EsB Crossbeam is a FIB/SEM system with an FESEM electron column, a Ga ion column, gas injection for Pt, W, and SiOx deposition, and multiple detector options.

The Zeiss Axio CSM 700 is a microscope with a controller.

The Zeiss Leo 1530 FE-SEM is a field emission scanning electron microscope with multiple detectors and an Oxford EDX detector.

Zeiss Contura G 2 is a coordinate measuring machine described as a metrology system for precise dimensional measurement, inspection, and quality control.

The Zeiss UEM is a brightfield microscope with reflected-light illumination, binocular viewing at 45°, and a coaxial X-Y stage.

The Zeiss Supra 55 VP is a variable-pressure scanning electron microscope with TFE source type, Windows 10, and SmartSEM v6.

The Zeiss Axioscope 7 is a microscope configured with transmitted and reflected light LED units, a trinocular phototube, a DIC manual objective turret, a right-handed XY rotary stage, a Colibri 7 fluorescent source, and a USB 3.0 color camera.

The Zeiss Leo 1550 is a scanning electron microscope.