Teradyne
Nextest Magnum 1 PV alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Advantest
93000 SOC
Test & Probe
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
LTX-Credence
Fusion HFT
Test & Probe
The LTX-Credence Fusion HFT is a configurable semiconductor tester used for device testing in production and NPI development.
Advantest
T 5503 HS
Test & Probe
The Advantest T5503HS is a high-speed memory test system designed for testing DDR4 and LPDDR4 SDRAMs.
Advantest
V 93000 PS 1600
Test & Probe
The Advantest V 93000 PS 1600 is a tester with an ATH (Advanced Test Head) configuration.
Tenney
, TPS JR-A-F4T Junior compact temperature test chambers
Test & Probe
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
Rorze
03 RR 8120-001-001 Wafer Exchanger
Test & Probe
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
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