Advantest
93000 SOC
The Advantest 93000 SOC is a system-on-chip (SOC) tester. The Advantest 93000 SOC was originally developed by Agilent Technologies. The Advantest 93000 SOC records test results and events to a binary Event Data Record (EDL) file.[1][2][3]
What it is
General reference — not yet source-verifiedA system-on-chip tester is automated test equipment used to electrically stimulate semiconductor devices and measure their responses. A tester of this class serves in device characterization, production test, and binning by applying digital patterns and power conditions through an interface to the device under test.
How it works
General reference — not yet source-verifiedAutomated test equipment of this class operates by connecting a device under test to instrument channels through a test interface. Digital channel resources drive logic states and timing patterns, while parametric and power resources force voltage or current and measure electrical behavior. Dedicated measurement options in this class can extend the platform toward mixed-signal or application-specific test tasks.
Where it fits in the process flow
General reference — not yet source-verifiedA tester of this class sits in the electrical test flow rather than in wafer fabrication process modules such as deposition, lithography, or etch. The machine is typically used after device fabrication when chips or packaged parts are ready for electrical verification through a probe or handler interface. The machine's results feed sorting, screening, characterization, and release decisions for downstream assembly or shipment steps.
Applications
General reference — not yet source-verifiedTesters in this class are used for electrical verification of integrated circuits during product development and manufacturing. Typical applications include functional test, parametric test, continuity and leakage checks, power-domain validation, and screening of devices that combine logic with other on-chip functions.
What do the numbers mean?
Power & electrical25
- Infra modules
- ACDC SD: Cabinet Primary Power Supply (3); DCDC A: Cage Secondary Power Supply; DCDC D: Cage Secondary Power Supply (3)[8]
- Digital modules
- C200e: 200MB/S Single Density (7); C400e: 400MB/S Single Density (8); HVPE: High Voltage PE[8]
- Infra modules
- ACDC_PS: Cabinet Primary Power Supply (3); DCDC_A: Cage Secondary Power Supply; DCDC_U: Cage Secondary Power Supply (3)[5]
- Infra modules
- ACDC PS: Cabinet Primary Power Supply (8); DCDC A: Cage Secondary Power Supply; DCDC U: Cage Secondary Power Supply (8)[6]
- DC modules
- HCDPS: High Current DPS 1Ch 4V/100A (2); HVDPS: High Voltage DPS 4Ch 22V/1A; MSDPS A: Multisite DPS 8 Ch 8V/4A (4)[6]
Configuration & options33
Vintage & configurations
Documented models & variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Advantest 93000 SOC Tester | — | — | Sources show differing installed module configurations, including dedicated, AC, infra, digital, and DC sections. | Equipment inventory listing[4] |
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Teradyne Nextest Magnum I PV— Same function class: Test & Probe, UnknownCompare in depthsource[11]
- Teradyne Nextest Magnum 1 PV— Same function class: Test & Probe, UnknownCompare in depthsource[12]
- Teradyne MicroFlex— Same function class: Test & Probe, UnknownCompare in depthsource[13]
- Teradyne J 750 S— Same function class: Test & Probe, UnknownCompare in depthsource[14]
- Teradyne J 750 EX— Same function class: Test & Probe, UnknownCompare in depthsource[15]
- LTX-Credence TMT ASL 1000 165— Same function class: Test & Probe, UnknownCompare in depthsource[16]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- ACDC SDCabinet Primary Power Supply (3)[4]
- DCDC ACage Secondary Power Supply[4]
- DCDC DCage Secondary Power Supply (3)[4]
- HVPEHigh Voltage PE[4]
- GPDPSGeneral Purpose DPS 4 Ch 8V/8A (4)[4]
- ACDC_PSCabinet Primary Power Supply (3)[5]
- DCDC_ACage Secondary Power Supply[5]
- DCDC_UCage Secondary Power Supply (3)[5]
- MSDPS AMultisite DPS 8 Ch 8V/4A (4)[5]
- ACDC PSCabinet Primary Power Supply (8)[6]
- DCDC UCage Secondary Power Supply (8)[6]
- HCDPSHigh Current DPS 1Ch 4V/100A (2)[6]
- High Voltage DPS (HVDPS)4Ch 22V/1A[6]
- High Current DPS (HCDPS)1Ch 4V/100A[6]
- General Purpose DPS (GPDPS)4 Ch 8V/8A[4]
- Multisite DPS (MSDPS A)8 Ch 8V/4A[5]
- HVDPSHigh Voltage DPS 4Ch 22V/1A[6]
- Infra modulesACDC SD: Cabinet Primary Power Supply (3); DCDC A: Cage Secondary Power Supply; DCDC D: Cage Secondary Power Supply (3)[8]
- Digital modulesC200e: 200MB/S Single Density (7); C400e: 400MB/S Single Density (8); HVPE: High Voltage PE[8]
- DC modulesGPDPS: General Purpose DPS 4 Ch 8V/8A (4)[8]
- Infra modulesACDC_PS: Cabinet Primary Power Supply (3); DCDC_A: Cage Secondary Power Supply; DCDC_U: Cage Secondary Power Supply (3)[5]
- DC modulesMSDPS A: Multisite DPS 8 Ch 8V/4A (4)[5]
- Infra modulesACDC PS: Cabinet Primary Power Supply (8); DCDC A: Cage Secondary Power Supply; DCDC U: Cage Secondary Power Supply (8)[6]
- DC modulesHCDPS: High Current DPS 1Ch 4V/100A (2); HVDPS: High Voltage DPS 4Ch 22V/1A; MSDPS A: Multisite DPS 8 Ch 8V/4A (4)[6]
- DC modulesMSDPS A: Multisite DPS 8 Ch 8V/4A (4); UHC4: Ultra High Current DPS[7]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What kind of device testing does the platform support at a general level?
It supports semiconductor device testing by applying test signals to a device under test and evaluating the response against expected behavior.[1]
Not publicly documented
The following facts about the 93000 SOC are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 93000 SOC are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the 93000 SOC are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 93000 SOC are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 93000 SOC is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the 93000 SOC are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (16)Every fact above is drawn from these public sources
- [1]US7924043B2 - Method and product for testing a device under test - Google Patents — patents.google.compatents.google.com
- [2]patents.google.com — patents.google.compatents.google.com
- [3]TWI424175B - System and method for formatting test data and machine-readable media - Google Patents — patents.google.compatents.google.com
- [4]Inventory photo
- [5]Inventory photo
- [6]Inventory photo
- [7]Inventory photo
- [8]Inventory photo
- [9]Inventory photo
- [10]Inventory photo
- [11]Equipment inventory listing
- [12]Equipment inventory listing
- [13]Equipment inventory listing
- [14]Equipment inventory listing
- [15]Equipment inventory listing
- [16]Equipment inventory listing
Last updated Oct 20, 2026.
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