Advantest
93000 SOC
What it is
General reference — not yet source-verifiedAs a class, a semiconductor tester applies stimulus to a device under test and evaluates the device response as part of automatic test equipment. Such systems are used to verify electrical and functional behavior before devices move onward in manufacturing.
Where it fits in the process flow
General reference — not yet source-verifiedThe system fits in semiconductor test and probe operations, where devices are electrically exercised and measured before later assembly or further qualification. It belongs in the back-end test portion of the process flow rather than in front-end wafer fabrication steps.
Applications
General reference — not yet source-verifiedAs a class, this type of tester is used for semiconductor integrated circuits that require functional and electrical verification under controlled stimulus and measurement conditions.
What do the numbers mean?
Power & electrical12
Configuration & options13
Vintage & configurations
Documented models & variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Advantest 93000 SOC Tester | — | — | Sources show differing installed module configurations, including dedicated, AC, infra, digital, and DC sections. | Equipment inventory listing[1] |
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Teradyne Nextest Magnum I PV— Same function class: Test & Probe, UnknownCompare in depthsource[7]
- Teradyne Nextest Magnum 1 PV— Same function class: Test & Probe, UnknownCompare in depthsource[8]
- Teradyne MicroFlex— Same function class: Test & Probe, UnknownCompare in depthsource[9]
- Teradyne J 750 S— Same function class: Test & Probe, UnknownCompare in depthsource[10]
- Teradyne J 750 EX— Same function class: Test & Probe, UnknownCompare in depthsource[11]
- LTX-Credence TMT ASL 1000 165— Same function class: Test & Probe, UnknownCompare in depthsource[12]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- ACDC SDCabinet Primary Power Supply (3)[1]
- DCDC ACage Secondary Power Supply[1]
- DCDC DCage Secondary Power Supply (3)[1]
- HVPEHigh Voltage PE[1]
- GPDPSGeneral Purpose DPS 4 Ch 8V/8A (4)[1]
- ACDC_PSCabinet Primary Power Supply (3)[2]
- DCDC_ACage Secondary Power Supply[2]
- DCDC_UCage Secondary Power Supply (3)[2]
- MSDPS AMultisite DPS 8 Ch 8V/4A (4)[2]
- ACDC PSCabinet Primary Power Supply (8)[3]
- DCDC UCage Secondary Power Supply (8)[3]
- HCDPSHigh Current DPS 1Ch 4V/100A (2)[3]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What kind of device testing does the platform support at a general level?
It supports semiconductor device testing by applying test signals to a device under test and evaluating the response against expected behavior.[13]
Not publicly documented
The following facts about the 93000 SOC are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 93000 SOC are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the 93000 SOC are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 93000 SOC are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 93000 SOC is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the 93000 SOC are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (15)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]Inventory photo
- [7]Equipment inventory listing
- [8]Equipment inventory listing
- [9]Equipment inventory listing
- [10]Equipment inventory listing
- [11]Equipment inventory listing
- [12]Equipment inventory listing
- [13]US7924043B2 - Method and product for testing a device under test - Google Patents — patents.google.compatents.google.com
- [14]TWI427499B - Apparatus for storing and formatting data - Google Patents — patents.google.compatents.google.com
- [15]TWI424175B - System and method for formatting test data and machine-readable media - Google Patents — patents.google.compatents.google.com
Last updated Jul 29, 2026.
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General referenceTeradyne J 750 S is a test and probe system used in semiconductor manufacturing. It belongs to the class of equipment that electrically evaluates integrated circuits while they are still on wafer or in related test handling workflows.
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